SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Design of omnidirectional camera lens system with catadioptic system

Jo, Jae Heung, Lehmann, Peter H., Osten, Wolfgang, Lee, Sangon, Seo, Hyeon Jin, Albertazzi, Armando, Lee, Jung Hwan, Kim, Joon Mo
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Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2019743
File:
PDF, 457 KB
english, 2013
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