Explore the new relationship between patents and market...

Scientometrics 2014 / 02 Vol. 98; Iss. 2

Explore the new relationship between patents and market value: a panel smooth transition regression (PSTR) approach

Chen, Yu-Shan, Shih, Chun-Yu, Chang, Ching-Hsun
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Volume:
98
Language:
english
Journal:
Scientometrics
DOI:
10.1007/s11192-013-1110-9
Date:
February, 2014
File:
PDF, 375 KB
english, 2014
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