Evaluation of both composition and strain distributions in...

Chinese Physics B 2010 / 10 Vol. 19; Iss. 10

Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques

Xi, Guo, Hui, Wang, De-Sheng, Jiang, Yu-Tian, Wang, De-Gang, Zhao, Jian-Jun, Zhu, Zong-Shun, Liu, Shu-Ming, Zhang, Hui, Yang
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Volume:
19
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/19/10/106802
Date:
October, 2010
File:
PDF, 1.48 MB
english, 2010
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