Analysis of indium incorporation in non- and semipolar...

Semiconductor Science and Technology 2012 / 02 Vol. 27; Iss. 2

Analysis of indium incorporation in non- and semipolar GaInN QW structures: comparing x-ray diffraction and optical properties

Jönen, H, Bremers, H, Rossow, U, Langer, T, Kruse, A, Hoffmann, L, Thalmair, J, Zweck, J, Schwaiger, S, Scholz, F, Hangleiter, A
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Volume:
27
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/27/2/024013
Date:
February, 2012
File:
PDF, 2.88 MB
english, 2012
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