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Mean escape depth of signal photoelectrons from amorphous and polycrystalline solids
Jablonski, A., Tilinin, I. S., Powell, C. J.Volume:
54
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.54.10927
Date:
October, 1996
File:
PDF, 264 KB
english, 1996