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SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Performance analysis of interrogators for fiber Bragg grating sensors based on arrayed waveguide gratings
Buck, Thorbjörn C., Lehmann, Peter H., Müller, Mathias S., Plattner, Markus, Koch, Alexander W.Volume:
7389
Year:
2009
Language:
english
DOI:
10.1117/12.827526
File:
PDF, 172 KB
english, 2009