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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - Optical fiber interference target flowmeter II: damper design
Sun, Zhengnai, Li, Pengsheng, Qiang, Xifu, Zhao, Yong, Zhang, Shulian, Gao, WeiVolume:
4222
Year:
2000
Language:
english
DOI:
10.1117/12.403874
File:
PDF, 89 KB
english, 2000