Effect of annealing on structural and electrical properties of ZnO and In 2 S 3 :Al thin layers
Jebbari, N, Ajili, M, Guasch, C, Kamoun, N, Bennaceur, RVolume:
13
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/13/1/012007
Date:
November, 2010
File:
PDF, 1.47 MB
english, 2010