Thickness dependence of optoelectronic properties in ALD...

Applied Surface Science 2014 / 01 Vol. 289

Thickness dependence of optoelectronic properties in ALD grown ZnO thin films

Singh, Trilok, Lehnen, Thomas, Leuning, Tessa, Sahu, Diptiranjan, Mathur, Sanjay
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Volume:
289
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2013.10.071
Date:
January, 2014
File:
PDF, 1.84 MB
english, 2014
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