Microhardness of Ti-N films containing the epsilon -Ti...

Journal of Physics D Applied Physics 1988 / 11 Vol. 21; Iss. 11

Microhardness of Ti-N films containing the epsilon -Ti 2 N phase

Poulek, V, Musil, J, Valvoda, V, Cerny, R
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Volume:
21
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/21/11/020
Date:
November, 1988
File:
PDF, 270 KB
english, 1988
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