Material characterization of high Sn-content,...

Journal of Crystal Growth 2013 / 2 Vol. 365

Material characterization of high Sn-content, compressively-strained GeSn epitaxial films after rapid thermal processing

Chen, Robert, Huang, Yi-Chiau, Gupta, Suyog, Lin, Angie C., Sanchez, Errol, Kim, Yihwan, Saraswat, Krishna C., Kamins, Theodore I., Harris, James S.
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Volume:
365
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2012.12.014
Date:
February, 2013
File:
PDF, 1.51 MB
english, 2013
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