Characterization of Single-Crystalline Aluminum Thin Film...

Japanese Journal of Applied Physics 2013 / 04 Vol. 52; Iss. 4R

Characterization of Single-Crystalline Aluminum Thin Film on (100) GaAs Substrate

Lin, Shi-Wei, Wu, Jau-Yang, Lin, Sheng-Di, Lo, Ming-Cheng, Lin, Ming-Huei, Liang, Chi-Te
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.045801
Date:
April, 2013
File:
PDF, 657 KB
english, 2013
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