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Electrical failure behaviors of semiconductor oxide nanowires
Nie, Anmin, Liu, Jiabin, Dong, Cezhou, Wang, HongtaoVolume:
22
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/22/40/405703
Date:
October, 2011
File:
PDF, 2.78 MB
english, 2011