Quantitative analysis of the weak anti-localization effect in ultrathin bismuth films
Sangiao, S., Marcano, N., Fan, J., Morellón, L., Ibarra, M. R., Teresa, J. M. DeVolume:
95
Language:
english
Journal:
EPL (Europhysics Letters)
DOI:
10.1209/0295-5075/95/37002
Date:
August, 2011
File:
PDF, 1.00 MB
english, 2011