Breakdown study of dc silicon micro-discharge devices
Schwaederlé, L, Kulsreshath, M K, Overzet, L J, Lefaucheux, P, Tillocher, T, Dussart, RVolume:
45
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/45/6/065201
Date:
February, 2012
File:
PDF, 1.11 MB
english, 2012