Carrier thermal escape and retrapping in self-assembled quantum dots
Sanguinetti, S., Henini, M., Grassi Alessi, M., Capizzi, M., Frigeri, P., Franchi, S.Volume:
60
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.60.8276
Date:
September, 1999
File:
PDF, 96 KB
english, 1999