High-precision nanoscale length measurement

High-precision nanoscale length measurement

Sheglov, D. V., Kosolobov, S. S., Fedina, L. I., Rodyakina, E. E., Gutakovskii, A. K., Sitnikov, S. V., Kozhukhov, A. S., Zagarskikh, S. A., Kopytov, V. V., Evgrafov, V. I., Shuvalov, G. V., Matveichu
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Volume:
8
Language:
english
Journal:
Nanotechnologies in Russia
DOI:
10.1134/S1995078013040162
Date:
July, 2013
File:
PDF, 1.14 MB
english, 2013
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