High-precision nanoscale length measurement
Sheglov, D. V., Kosolobov, S. S., Fedina, L. I., Rodyakina, E. E., Gutakovskii, A. K., Sitnikov, S. V., Kozhukhov, A. S., Zagarskikh, S. A., Kopytov, V. V., Evgrafov, V. I., Shuvalov, G. V., MatveichuVolume:
8
Language:
english
Journal:
Nanotechnologies in Russia
DOI:
10.1134/S1995078013040162
Date:
July, 2013
File:
PDF, 1.14 MB
english, 2013