Thickness dependence of the properties of transparent...

Thickness dependence of the properties of transparent conducting ZnO:Zr films deposited on flexible substrates by RF magnetron sputtering

Huafu, Zhang, Chengxin, Lei, Hanfa, Liu, Changkun, Yuan
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Volume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/4/043004
Date:
April, 2009
File:
PDF, 232 KB
english, 2009
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