Adapted waveform analysis as a tool for modeling, feature...

Optical Engineering 1994 / 07 Vol. 33; Iss. 7

Adapted waveform analysis as a tool for modeling, feature extraction, and denoising

Wickerhauser, Mladen V.
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Volume:
33
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/12.173206
Date:
July, 1994
File:
PDF, 283 KB
english, 1994
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