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Dominant role of grain boundary scattering in the resistivity of nanometric Cu films
Sun, Tik, Yao, Bo, Warren, Andrew P., Barmak, Katayun, Toney, Michael F., Peale, Robert E., Coffey, Kevin R.Volume:
79
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.79.041402
Date:
January, 2009
File:
PDF, 215 KB
english, 2009