Determination of heteroepitaxial layer relaxation at growth...

Journal of Crystal Growth 2013 / 4 Vol. 368

Determination of heteroepitaxial layer relaxation at growth temperature from room temperature X-ray reciprocal space maps

Roesener, Tobias, Klinger, Vera, Weuffen, Christoph, Lackner, David, Dimroth, Frank
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Volume:
368
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2013.01.007
Date:
April, 2013
File:
PDF, 940 KB
english, 2013
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