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Analysis of synthetic diamond single crystals by X-ray topography and double-crystal diffractometry
Prokhorov, I. A., Ralchenko, V. G., Bolshakov, A. P., Polskiy, A. V., Vlasov, A. V., Subbotin, I. A., Podurets, K. M., Pashaev, E. M., Sozontov, E. A.Volume:
58
Language:
english
Journal:
Crystallography Reports
DOI:
10.1134/S1063774513070146
Date:
December, 2013
File:
PDF, 1.91 MB
english, 2013