Proton-Induced Upsets in SLC and MLC NAND Flash Memories
Bagatin, Marta, Gerardin, Simone, Paccagnella, Alessandro, Ferlet-Cavrois, Veronique, Schwank, James R., Shaneyfelt, Marty R., Visconti, AngeloVolume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2290033
Date:
December, 2013
File:
PDF, 571 KB
english, 2013