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High-Frequency Characterization of Contact Resistance and...

IEEE Transactions on Microwave Theory and Techniques 2011 / 10 Vol. 59; Iss. 10

High-Frequency Characterization of Contact Resistance and Conductivity of Platinum Nanowires

Kim, Kichul, Wallis, T. Mitch, Rice, Paul, Gu, Dazhen, Lim, Sang-Hyun, Imtiaz, Atif, Kabos, Pavel, Filipovic, Dejan S.
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2011.2163417
Date:
October, 2011
File:
PDF, 787 KB
english, 2011
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