SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holography

Kebbel, Volker, Geldmacher, Jurgen, Partes, Knut, Juptner, Werner, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.
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Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612531
File:
PDF, 671 KB
english, 2005
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