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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - Modeling from local to subsystem level effects in analog and digital circuits due space induced Single Event Transients
Perez, Reinaldo JYear:
2011
Language:
english
DOI:
10.1109/ISEMC.2011.6038328
File:
PDF, 892 KB
english, 2011