Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
Bartosik, M., Daniel, R., Mitterer, C., Matko, I., Burghammer, M., Mayrhofer, P.H., Keckes, J.Volume:
542
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.05.102
Date:
September, 2013
File:
PDF, 655 KB
english, 2013