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Improvements in Silicon Oxide Dielectric Loss for Superconducting Microwave Detector Circuits
Li, D., Gao, J., Austermann, J. E., Beall, J. A., Becker, D., Cho, H., Fox, A. E., Halverson, N., Henning, J., Hilton, G. C., Hubmayr, J., Irwin, K. D., Van Lanen, J., Nibarger, J., Niemack, M.Volume:
23
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2013.2242951
Date:
June, 2013
File:
PDF, 793 KB
english, 2013