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[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - A study in coverage-driven test generation
Benjamin, Mike, Geist, Daniel, Hartman, Alan, Mas, Gerard, Smeets, Ralph, Wolfsthal, YaronYear:
1999
Language:
english
DOI:
10.1145/309847.310108
File:
PDF, 65 KB
english, 1999