Effects of irradiation temperature on MOS radiation response
Shaneyfelt, M.R., Schwank, J.R., Fleetwood, D.M., Winokur, P.S.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685209
Date:
June, 1998
File:
PDF, 753 KB
english, 1998