SPIE Proceedings [SPIE Electron Technology Conference 2013 - Ryn, Poland (Tuesday 16 April 2013)] Electron Technology Conference 2013 - Characterisation of AP-MOVPE grown (Ga, In)(N, As) structures by Raman spectroscopy
Badura, Mikołaj, Ściana, Beata, Radziewicz, Damian, Pucicki, Damian, Bielak, Katarzyna, Dawidowski, Wojciech, Kamyczek, Paulina, Płaczek-Popko, Ewa, Tłaczała, Marek, Szczepanski, Pawel, Kisiel, RyszarVolume:
8902
Year:
2013
Language:
english
DOI:
10.1117/12.2031297
File:
PDF, 950 KB
english, 2013