On the use of a bias-light correction for trapping effects...

Journal of Applied Physics 2001 Vol. 89; Iss. 5

On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon

Macdonald, Daniel, Sinton, Ronald A., Cuevas, Andrés
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Volume:
89
Year:
2001
Language:
english
DOI:
10.1063/1.1346652
File:
PDF, 351 KB
english, 2001
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