![](/img/cover-not-exists.png)
In Situ Characterizations of Nanostructured SnO x /Pt(111) Surfaces Using Ambient-Pressure XPS (APXPS) and High-Pressure Scanning Tunneling Microscopy (HPSTM)
Axnanda, Stephanus, Zhu, Zhongwei, Zhou, Weiping, Mao, Baohua, Chang, Rui, Rani, Sana, Crumlin, Ethan, Somorjai, Gabor, Liu, ZhiVolume:
118
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp409272j
Date:
January, 2014
File:
PDF, 1.26 MB
english, 2014