Fine Probe for an STM-SQUID Probe Microscope

IEEE Transactions on Appiled Superconductivity 2013 / 06 Vol. 23; Iss. 3

Fine Probe for an STM-SQUID Probe Microscope

Watanabe, N., Miyato, Y., Matsusawa, S., Tachiki, M., Hayashi, T., Itozaki, H.
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Volume:
23
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2012.2235506
Date:
June, 2013
File:
PDF, 600 KB
english, 2013
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