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Growth andin situhigh-pressure reflection high energy electron diffraction monitoring of oxide thin films
Li, Jie, Peng, Wei, Chen, Ke, Wang, Ping, Chu, HaiFeng, Chen, YingFei, Zheng, DongNingVolume:
56
Language:
english
Journal:
Science China Physics, Mechanics and Astronomy
DOI:
10.1007/s11433-013-5352-6
Date:
December, 2013
File:
PDF, 1.54 MB
english, 2013