Microstructure study of amorphous vanadium oxide thin films...

Journal of Applied Physics 2002 / 8 Vol. 92; Iss. 4

Microstructure study of amorphous vanadium oxide thin films using raman spectroscopy

Lee, Se-Hee, Cheong, Hyeonsik M., Je Seong, Maeng, Liu, Ping, Tracy, C. Edwin, Mascarenhas, Angelo, Pitts, J. Roland, Deb, Satyen K.
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Volume:
92
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1495074
Date:
August, 2002
File:
PDF, 334 KB
english, 2002
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