Empirical modeling of low-frequency dispersive effects due...

IEEE Transactions on Microwave Theory and Techniques 1995 / Dec. Vol. 43; Iss. 12

Empirical modeling of low-frequency dispersive effects due to traps and thermal phenomena in III-V FET's

Filicori, F., Vannini, G., Santarelli, A., Sanchez, A.M., Tazon, A., Newport, Y.
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Volume:
43
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/22.475663
Date:
January, 1995
File:
PDF, 1.13 MB
english, 1995
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