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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Spectroscopic investigation of high-pressure micro-hollow cathode discharges
Jiang, Chao, Wang, Youqing, Hou, Xun, Yuan, Jiahu, Wyant, James C., Wang, Hexin, Han, SenVolume:
6150
Year:
2006
Language:
english
DOI:
10.1117/12.676518
File:
PDF, 300 KB
english, 2006