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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Use of the surface PSD and incident angle adjustments to investigate near specular scatter from smooth surfaces
Tayabaly, Kashmira, Stover, John C., Parks, Robert E., Dubin, Matthew, Burge, James H., Fähnle, Oliver W., Williamson, Ray, Kim, Dae WookVolume:
8838
Year:
2013
Language:
english
DOI:
10.1117/12.2024612
File:
PDF, 1.29 MB
english, 2013