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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Fermi level pinning with sub-monolayer MeOx and metal gates [MOSFETs]
Samavedam, S.B., La, L.B., Tobin, P.J., White, B., Hobbs, C., Fonseca, L.R.C., Demkov, A.A., Schaeffer, J., Luckowski, E., Martinez, A., Raymond, M., Triyoso, D., Roan, D., Dhandapani, V., Garcia, R.,Year:
2003
Language:
english
DOI:
10.1109/IEDM.2003.1269286
File:
PDF, 230 KB
english, 2003