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SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Diode laser spectroscopy for on-line chemical analysis
Bomse, David S., Hovde, D. Christian, Oh, Daniel B., Silver, Joel A., Stanton, Alan C., Bomse, David S., Brittain, Harry, Farquharson, Stuart, Lerner, Jeremy M., Rein, Alan J., Sohl, Cary, Todd, TerryVolume:
1681
Year:
1992
Language:
english
DOI:
10.1117/12.137730
File:
PDF, 917 KB
english, 1992