Surface morphology and composition studies in InGaN/GaN...

Journal of Semiconductors 2011 / 08 Vol. 32; Iss. 8

Surface morphology and composition studies in InGaN/GaN film grown by MOCVD

Tao, Tao, Zhang, Zhao, Liu, Lian, Su, Hui, Xie, Zili, Zhang, Rong, Liu, Bin, Xiu, Xiangqian, Li, Yi, Han, Ping, Shi, Yi, Zheng, Youdou
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Volume:
32
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/32/8/083002
Date:
August, 2011
File:
PDF, 1.31 MB
english, 2011
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