Scanning force microscopy; with applications to electric,...

Scanning force microscopy; with applications to electric, magnetic, and atomic forces: By Dror Sarid. Oxford University Press, New York, 1991. xi + 254 pp. $45

Donald A. Chernoff
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Volume:
98
Year:
1992
Language:
english
Pages:
2
DOI:
10.1016/0022-4596(92)90092-a
File:
PDF, 198 KB
english, 1992
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