Copper oxide phase content and its effect on the electric pulse induced resistive switching characteristics of CuxO resistive random access memory
Ebrahim, Rabi, Zomorrodian, Ali, Wu, Naijuan, Ignatiev, AlexVolume:
539
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.04.142
Date:
July, 2013
File:
PDF, 684 KB
english, 2013