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SPIE Proceedings [SPIE International Conference on Applied Optical Metrology - Balatonfured, Hungary (Monday 8 June 1998)] International Conference on Applied Optical Metrology - Digital holography: methods and applications
Kreis, Thomas M., Jueptner, Werner P. O., Geldmacher, Juergen, Rastogi, Pramod K., Gyimesi, FerencVolume:
3407
Year:
1998
Language:
english
DOI:
10.1117/12.323309
File:
PDF, 1.64 MB
english, 1998