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X-ray diffraction study of short-period AlN/GaN superlattices
Kyutt, R. N., Shcheglov, M. P., Ratnikov, V. V., Yagovkina, M. A., Davydov, V. Yu., Smirnov, A. N., Rozhavskaya, M. M., Zavarin, E. E., Lundin, V. V.Volume:
58
Language:
english
Journal:
Crystallography Reports
DOI:
10.1134/S1063774513070109
Date:
December, 2013
File:
PDF, 207 KB
english, 2013