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SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Optical Fabrication, Testing, and Metrology II - Comparison of different magnetorheological polishing fluids
Schinhaerl, Markus, Pitschke, Elmar, Geiss, Andreas, Rascher, Rolf, Sperber, Peter, Stamp, Richard, Smith, Lyndon, Smith, Gordon, Duparré, Angela, Geyl, Roland, Wang, LingliVolume:
5965
Year:
2005
Language:
english
DOI:
10.1117/12.656430
File:
PDF, 939 KB
english, 2005