[IEEE International Electron Devices Meeting. Technical...

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[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - 15 nm gate length planar CMOS transistor

Bin Yu,, Haihong Wang,, Joshi, A., Qi Xiang,, Effiong Ibok,, Ming-Ren Lin,
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Year:
2001
Language:
english
DOI:
10.1109/IEDM.2001.979669
File:
PDF, 300 KB
english, 2001
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