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On the application of methods of positron annihilation spectroscopy for studying radiation-stimulated processes in chalcogenide glassy semiconductors
Kavetskyy, T. S., Tsmots, V. M., Šauša, O., Stepanov, A. L.Volume:
48
Language:
english
Journal:
Semiconductors
DOI:
10.1134/S1063782614010151
Date:
January, 2014
File:
PDF, 161 KB
english, 2014