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Creep compliance mapping by atomic force microscopy
Braunsmann, Christoph, Proksch, Roger, Revenko, Irène, Schäffer, Tilman E.Volume:
55
Language:
english
Journal:
Polymer
DOI:
10.1016/j.polymer.2013.11.029
Date:
January, 2014
File:
PDF, 1.79 MB
english, 2014